Abstract

Glass characterization with XPS and ToF-SIMS techniques

Glass characterization with XPS and ToF-SIMS techniques

Laurent DUPUY*, Julien AMALRIC, Céline BRUNON

SERMA TECHNOLOGIES, 64 chemin des Mouilles 69130 ECULLY, FRANCE

At SERMA TECHNOLOGIES we provide analysis service for academics and industrial companies.
Through examples we will demonstrate the interest of XPS and ToF-SIMS techniques to study glass alteration, glass treatments and glass defects.

  • Type: Poster
  • Related categories: Glass alteration